TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_23_03
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-019-06 | FUSED_ID : 6359364768413806902
  IC_TEMP :  -64.07 | VDDM : 1118.48 | AUX_INT :   -7.55 | CsaBias :   82.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33763e-03 / 2
  ADC_P0  : -7.55148e-03 ± 2.48466e-02
  ADC_P1  : 8.20358e-03 ± 6.10477e-04
  ADC_P2  : -4.94307e-06 ± 2.97207e-06
  CSA_Chi2/NDF : 1.49629e-04 / 2
  CSA_P0  : 5.95554e-02 ± 8.15887e-03
  CSA_P1  : 1.01042e-02 ± 6.14712e-04
  CSA_P2  : -5.27127e-05 ± 9.36133e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [16, 46]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3137', '1.800', '0.1772', '1.799', '0.0930', '7.000', '0.7083', 1, 1, 1, 1, 1728318182.6879966]
VI_after__Init : ['1.202', '0.3138', '1.800', '0.1772', '1.802', '0.0861', '7.000', '0.7079', 1, 1, 1, 1, 1728318190.8203447]
VI_at__the_End : ['1.199', '0.4756', '1.800', '0.1384', '1.807', '0.1155', '7.000', '0.7083', 1, 1, 1, 1, 1728318255.0514474]