TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_18_06
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-022-06 | FUSED_ID : 6359364768413806950
  IC_TEMP :  -74.77 | VDDM : 1122.92 | AUX_INT :   -9.42 | CsaBias :   62.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35663e-03 / 2
  ADC_P0  : -9.42034e-03 ± 2.48766e-02
  ADC_P1  : 9.01205e-03 ± 6.33243e-04
  ADC_P2  : -7.97636e-06 ± 3.18889e-06
  CSA_Chi2/NDF : 1.56076e-04 / 2
  CSA_P0  : 6.04908e-02 ± 8.33278e-03
  CSA_P1  : 9.97810e-03 ± 6.27815e-04
  CSA_P2  : -5.54842e-05 ± 9.56087e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [15]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [11, 28]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2355', '1.800', '0.1759', '1.799', '0.0893', '7.000', '0.7075', 1, 1, 1, 1, 1728317886.3866699]
VI_after__Init : ['1.202', '0.2356', '1.800', '0.1759', '1.799', '0.0835', '7.000', '0.7076', 1, 1, 1, 1, 1728317894.444074]
VI_at__the_End : ['1.202', '0.4646', '1.800', '0.1391', '1.799', '0.1226', '7.000', '0.7083', 1, 1, 1, 1, 1728317961.0859044]