TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_16_28
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-023-06 | FUSED_ID : 6359364768413806966
  IC_TEMP :  -67.70 | VDDM : 1121.88 | AUX_INT :   -9.13 | CsaBias :   52.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26872e-03 / 2
  ADC_P0  : -9.13364e-03 ± 2.40766e-02
  ADC_P1  : 8.78379e-03 ± 6.05289e-04
  ADC_P2  : -7.10342e-06 ± 3.01718e-06
  CSA_Chi2/NDF : 1.77088e-04 / 2
  CSA_P0  : 5.65008e-02 ± 8.87599e-03
  CSA_P1  : 1.03160e-02 ± 6.68741e-04
  CSA_P2  : -5.77840e-05 ± 1.01841e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [106, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1220', '1.800', '0.1398', '1.799', '0.0853', '7.000', '0.7074', 1, 1, 1, 1, 1728317788.3951879]
VI_after__Init : ['1.202', '0.1220', '1.800', '0.1399', '1.801', '0.0800', '7.000', '0.7075', 1, 1, 1, 1, 1728317796.4644136]
VI_at__the_End : ['1.201', '0.4725', '1.800', '0.1372', '1.801', '0.1191', '7.000', '0.7081', 1, 1, 1, 1, 1728317857.4159162]