TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_13_11
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-007-025-06 | FUSED_ID : 6359364768413806998
  IC_TEMP :  -65.58 | VDDM : 1113.64 | AUX_INT :   -8.50 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28857e-03 / 2
  ADC_P0  : -8.49501e-03 ± 2.43230e-02
  ADC_P1  : 8.40742e-03 ± 5.98281e-04
  ADC_P2  : -5.88121e-06 ± 2.91751e-06
  CSA_Chi2/NDF : 1.71734e-04 / 2
  CSA_P0  : 5.74948e-02 ± 8.74078e-03
  CSA_P1  : 9.89094e-03 ± 6.58554e-04
  CSA_P2  : -4.95476e-05 ± 1.00290e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [45, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3075', '1.800', '0.1455', '1.800', '0.0879', '7.000', '0.7074', 1, 1, 1, 1, 1728317591.0852306]
VI_after__Init : ['1.202', '0.3078', '1.800', '0.1455', '1.800', '0.0824', '7.000', '0.7074', 1, 1, 1, 1, 1728317599.1365876]
VI_at__the_End : ['1.202', '0.4795', '1.800', '0.1386', '1.804', '0.1153', '7.000', '0.7081', 1, 1, 1, 1, 1728317660.5769138]