TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_50_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-002-05 | FUSED_ID : 6359364768413810725
  IC_TEMP :  -77.52 | VDDM : 1117.20 | AUX_INT :   -8.58 | CsaBias :   63.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53158e-03 / 2
  ADC_P0  : -8.58236e-03 ± 2.64747e-02
  ADC_P1  : 9.03951e-03 ± 6.80209e-04
  ADC_P2  : -7.82705e-06 ± 3.45883e-06
  CSA_Chi2/NDF : 1.97957e-04 / 2
  CSA_P0  : 5.74622e-02 ± 9.38442e-03
  CSA_P1  : 1.00174e-02 ± 7.07048e-04
  CSA_P2  : -5.50614e-05 ± 1.07675e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1396', '1.800', '0.1395', '1.799', '0.0912', '7.000', '0.7078', 1, 1, 1, 1, 1728319857.5004284]
VI_after__Init : ['1.202', '0.1396', '1.800', '0.1395', '1.800', '0.0854', '7.000', '0.7079', 1, 1, 1, 1, 1728319865.5107946]
VI_at__the_End : ['1.202', '0.4639', '1.800', '0.1384', '1.806', '0.1201', '7.000', '0.7086', 1, 1, 1, 1, 1728319925.0392344]