TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_52_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-003-05 | FUSED_ID : 6359364768413810741
  IC_TEMP :  -70.15 | VDDM : 1112.58 | AUX_INT :  -10.44 | CsaBias :   60.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75740e-03 / 2
  ADC_P0  : -1.04416e-02 ± 2.84127e-02
  ADC_P1  : 8.89213e-03 ± 7.25850e-04
  ADC_P2  : -6.92644e-06 ± 3.69201e-06
  CSA_Chi2/NDF : 2.04245e-04 / 2
  CSA_P0  : 5.68110e-02 ± 9.53230e-03
  CSA_P1  : 9.97685e-03 ± 7.18190e-04
  CSA_P2  : -5.43590e-05 ± 1.09372e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [14, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1715', '1.800', '0.1838', '1.799', '0.0851', '7.000', '0.7080', 1, 1, 1, 1, 1728319956.537725]
VI_after__Init : ['1.202', '0.1716', '1.800', '0.1839', '1.799', '0.0796', '7.000', '0.7078', 1, 1, 1, 1, 1728319964.6401527]
VI_at__the_End : ['1.202', '0.4653', '1.800', '0.1398', '1.800', '0.1197', '7.000', '0.7083', 1, 1, 1, 1, 1728320024.456617]