TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_54_15
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-004-05 | FUSED_ID : 6359364768413810757
  IC_TEMP :  -65.73 | VDDM : 1123.12 | AUX_INT :   -9.34 | CsaBias :   76.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55957e-03 / 2
  ADC_P0  : -9.34282e-03 ± 2.67973e-02
  ADC_P1  : 8.62625e-03 ± 6.77663e-04
  ADC_P2  : -5.95649e-06 ± 3.40848e-06
  CSA_Chi2/NDF : 1.90001e-04 / 2
  CSA_P0  : 5.86741e-02 ± 9.19390e-03
  CSA_P1  : 1.01129e-02 ± 6.92694e-04
  CSA_P2  : -5.34791e-05 ± 1.05489e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [62, 81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [35]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1938', '1.800', '0.1340', '1.799', '0.0843', '7.000', '0.7080', 1, 1, 1, 1, 1728320055.0083005]
VI_after__Init : ['1.202', '0.1939', '1.800', '0.1338', '1.802', '0.0791', '7.000', '0.7078', 1, 1, 1, 1, 1728320063.0256307]
VI_at__the_End : ['1.202', '0.4779', '1.800', '0.1417', '1.804', '0.1179', '7.000', '0.7085', 1, 1, 1, 1, 1728320124.3118796]