TEST_NAME : Wafer
TEST_DATE : 24_10_07-18_55_53
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-005-05 | FUSED_ID : 6359364768413810773
  IC_TEMP :  -64.48 | VDDM : 1116.46 | AUX_INT :  -10.29 | CsaBias :   83.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85526e-03 / 2
  ADC_P0  : -1.02926e-02 ± 2.92384e-02
  ADC_P1  : 8.55270e-03 ± 7.26564e-04
  ADC_P2  : -6.03906e-06 ± 3.59669e-06
  CSA_Chi2/NDF : 2.01952e-04 / 2
  CSA_P0  : 5.67908e-02 ± 9.47866e-03
  CSA_P1  : 1.01843e-02 ± 7.14149e-04
  CSA_P2  : -5.51385e-05 ± 1.08756e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2419', '1.800', '0.1360', '1.799', '0.0865', '7.000', '0.7082', 1, 1, 1, 1, 1728320153.5397232]
VI_after__Init : ['1.202', '0.2421', '1.800', '0.1360', '1.799', '0.0810', '7.000', '0.7077', 1, 1, 1, 1, 1728320161.6431475]
VI_at__the_End : ['1.202', '0.4777', '1.800', '0.1386', '1.805', '0.1167', '7.000', '0.7086', 1, 1, 1, 1, 1728320227.165038]