TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_04_07
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-010-05 | FUSED_ID : 6359364768413810853
  IC_TEMP :  -65.34 | VDDM : 1121.64 | AUX_INT :   -7.00 | CsaBias :   84.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24880e-03 / 2
  ADC_P0  : -7.00206e-03 ± 2.39628e-02
  ADC_P1  : 8.34302e-03 ± 5.92613e-04
  ADC_P2  : -5.45829e-06 ± 2.90338e-06
  CSA_Chi2/NDF : 1.70458e-04 / 2
  CSA_P0  : 5.86006e-02 ± 8.70824e-03
  CSA_P1  : 9.92252e-03 ± 6.56103e-04
  CSA_P2  : -5.24406e-05 ± 9.99168e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2194', '1.800', '0.1327', '1.799', '0.0851', '7.000', '0.7081', 1, 1, 1, 1, 1728320647.3937905]
VI_after__Init : ['1.202', '0.2194', '1.800', '0.1327', '1.802', '0.0794', '7.000', '0.7080', 1, 1, 1, 1, 1728320655.5131533]
VI_at__the_End : ['1.202', '0.4730', '1.800', '0.1356', '1.804', '0.1192', '7.000', '0.7087', 1, 1, 1, 1, 1728320718.3264253]