TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_05_46
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-011-05 | FUSED_ID : 6359364768413810869
  IC_TEMP :  -68.01 | VDDM : 1118.79 | AUX_INT :   -7.86 | CsaBias :   61.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.72771e-04 / 2
  ADC_P0  : -7.85838e-03 ± 2.10588e-02
  ADC_P1  : 8.71619e-03 ± 5.25862e-04
  ADC_P2  : -7.15601e-06 ± 2.59423e-06
  CSA_Chi2/NDF : 1.72225e-04 / 2
  CSA_P0  : 5.86049e-02 ± 8.75327e-03
  CSA_P1  : 1.01016e-02 ± 6.59496e-04
  CSA_P2  : -5.40425e-05 ± 1.00433e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [28]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [11, 100, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1984', '1.800', '0.1829', '1.800', '0.0858', '7.000', '0.7078', 1, 1, 1, 1, 1728320745.505344]
VI_after__Init : ['1.202', '0.1986', '1.800', '0.1829', '1.800', '0.0800', '7.000', '0.7079', 1, 1, 1, 1, 1728320754.2167184]
VI_at__the_End : ['1.202', '0.4770', '1.800', '0.1384', '1.801', '0.1181', '7.000', '0.7086', 1, 1, 1, 1, 1728320817.5288212]