TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_07_25
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-012-05 | FUSED_ID : 6359364768413810885
  IC_TEMP :  -67.18 | VDDM : 1118.96 | AUX_INT :   -9.39 | CsaBias :   76.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58060e-03 / 2
  ADC_P0  : -9.38797e-03 ± 2.68944e-02
  ADC_P1  : 8.67906e-03 ± 6.66555e-04
  ADC_P2  : -6.82450e-06 ± 3.28878e-06
  CSA_Chi2/NDF : 1.85724e-04 / 2
  CSA_P0  : 5.92629e-02 ± 9.08983e-03
  CSA_P1  : 1.01338e-02 ± 6.84853e-04
  CSA_P2  : -5.56318e-05 ± 1.04295e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [21]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [49]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2221', '1.800', '0.1393', '1.799', '0.0905', '7.000', '0.7076', 1, 1, 1, 1, 1728320844.7907567]
VI_after__Init : ['1.202', '0.2220', '1.800', '0.1393', '1.801', '0.0849', '7.000', '0.7079', 1, 1, 1, 1, 1728320852.8691037]
VI_at__the_End : ['1.202', '0.4749', '1.800', '0.1380', '1.805', '0.1181', '7.000', '0.7086', 1, 1, 1, 1, 1728320918.6400495]