TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_09_03
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-013-05 | FUSED_ID : 6359364768413810901
  IC_TEMP :  -65.73 | VDDM : 1119.05 | AUX_INT :   -8.33 | CsaBias :   61.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50103e-03 / 2
  ADC_P0  : -8.32971e-03 ± 2.62212e-02
  ADC_P1  : 8.81475e-03 ± 6.63109e-04
  ADC_P2  : -7.17065e-06 ± 3.31818e-06
  CSA_Chi2/NDF : 1.47168e-04 / 2
  CSA_P0  : 5.82635e-02 ± 8.09149e-03
  CSA_P1  : 1.00202e-02 ± 6.09635e-04
  CSA_P2  : -5.17451e-05 ± 9.28403e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4318', '1.800', '0.1729', '1.799', '0.0939', '7.000', '0.7079', 1, 1, 1, 1, 1728320943.5041525]
VI_after__Init : ['1.202', '0.4324', '1.800', '0.1729', '1.800', '0.0886', '7.000', '0.7078', 1, 1, 1, 1, 1728320951.7445376]
VI_at__the_End : ['1.202', '0.4790', '1.800', '0.1387', '1.802', '0.1142', '7.000', '0.7087', 1, 1, 1, 1, 1728321012.5368755]