TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_10_42
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-014-05 | FUSED_ID : 6359364768413810917
  IC_TEMP :  -65.80 | VDDM : 1129.01 | AUX_INT :   -9.85 | CsaBias :   83.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57450e-03 / 2
  ADC_P0  : -9.85329e-03 ± 2.68948e-02
  ADC_P1  : 8.52782e-03 ± 6.62371e-04
  ADC_P2  : -6.23574e-06 ± 3.24806e-06
  CSA_Chi2/NDF : 1.32590e-04 / 2
  CSA_P0  : 5.98629e-02 ± 7.68031e-03
  CSA_P1  : 9.97472e-03 ± 5.78656e-04
  CSA_P2  : -5.20581e-05 ± 8.81224e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [24, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [14]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1502', '1.800', '0.1673', '1.800', '0.0912', '7.000', '0.7079', 1, 1, 1, 1, 1728321042.399534]
VI_after__Init : ['1.202', '0.1502', '1.800', '0.1672', '1.802', '0.0861', '7.000', '0.7079', 1, 1, 1, 1, 1728321050.531965]
VI_at__the_End : ['1.201', '0.4760', '1.800', '0.1398', '1.803', '0.1180', '7.000', '0.7086', 1, 1, 1, 1, 1728321111.315338]