TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_22_11
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-021-02 | FUSED_ID : 6359364768413811026
  IC_TEMP :  -60.77 | VDDM : 1124.64 | AUX_INT :   -8.77 | CsaBias :   75.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41134e-03 / 2
  ADC_P0  : -8.76529e-03 ± 2.54204e-02
  ADC_P1  : 8.47938e-03 ± 6.18025e-04
  ADC_P2  : -6.72850e-06 ± 2.96675e-06
  CSA_Chi2/NDF : 1.57266e-04 / 2
  CSA_P0  : 5.78079e-02 ± 8.36451e-03
  CSA_P1  : 1.01441e-02 ± 6.30205e-04
  CSA_P2  : -5.04898e-05 ± 9.59728e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2013', '1.800', '0.1468', '1.799', '0.0851', '7.000', '0.7079', 1, 1, 1, 1, 1728321731.51275]
VI_after__Init : ['1.202', '0.2013', '1.800', '0.1467', '1.800', '0.0796', '7.000', '0.7081', 1, 1, 1, 1, 1728321739.6631444]
VI_at__the_End : ['1.202', '0.4896', '1.800', '0.1383', '1.808', '0.1166', '7.000', '0.7090', 1, 1, 1, 1, 1728321801.5514216]