TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_23_50
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-022-02 | FUSED_ID : 6359364768413811042
  IC_TEMP :  -64.75 | VDDM : 1117.73 | AUX_INT :  -10.59 | CsaBias :   73.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72514e-03 / 2
  ADC_P0  : -1.05894e-02 ± 2.81126e-02
  ADC_P1  : 8.42930e-03 ± 6.72647e-04
  ADC_P2  : -6.61961e-06 ± 3.20010e-06
  CSA_Chi2/NDF : 1.46225e-04 / 2
  CSA_P0  : 5.74858e-02 ± 8.06552e-03
  CSA_P1  : 9.89102e-03 ± 6.07679e-04
  CSA_P2  : -5.02319e-05 ± 9.25423e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [27, 75]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [11]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3190', '1.800', '0.1592', '1.800', '0.0926', '7.000', '0.7081', 1, 1, 1, 1, 1728321830.0912273]
VI_after__Init : ['1.202', '0.3189', '1.800', '0.1591', '1.801', '0.0872', '7.000', '0.7080', 1, 1, 1, 1, 1728321838.3165994]
VI_at__the_End : ['1.201', '0.4777', '1.800', '0.1379', '1.799', '0.1181', '7.000', '0.7087', 1, 1, 1, 1, 1728321903.3215337]