TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_25_29
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-023-02 | FUSED_ID : 6359364768413811058
  IC_TEMP :  -63.78 | VDDM : 1117.43 | AUX_INT :   -8.46 | CsaBias :   68.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13122e-03 / 2
  ADC_P0  : -8.45689e-03 ± 2.27450e-02
  ADC_P1  : 8.58120e-03 ± 5.63052e-04
  ADC_P2  : -6.58012e-06 ± 2.76285e-06
  CSA_Chi2/NDF : 1.71243e-04 / 2
  CSA_P0  : 5.83932e-02 ± 8.72827e-03
  CSA_P1  : 1.02871e-02 ± 6.57612e-04
  CSA_P2  : -5.44431e-05 ± 1.00147e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [18, 79]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3442', '1.800', '0.1517', '1.799', '0.0930', '7.000', '0.7088', 1, 1, 1, 1, 1728321929.2875354]
VI_after__Init : ['1.202', '0.3444', '1.800', '0.1517', '1.800', '0.0852', '7.000', '0.7082', 1, 1, 1, 1, 1728321937.3299372]
VI_at__the_End : ['1.202', '0.4858', '1.800', '0.1394', '1.807', '0.1151', '7.000', '0.7087', 1, 1, 1, 1, 1728322001.1090713]