TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_27_07
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-024-02 | FUSED_ID : 6359364768413811074
  IC_TEMP :  -63.57 | VDDM : 1117.80 | AUX_INT :   -8.43 | CsaBias :   79.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06900e-03 / 2
  ADC_P0  : -8.42656e-03 ± 2.21134e-02
  ADC_P1  : 8.08433e-03 ± 5.19530e-04
  ADC_P2  : -5.54436e-06 ± 2.42629e-06
  CSA_Chi2/NDF : 1.45742e-04 / 2
  CSA_P0  : 5.59923e-02 ± 8.05220e-03
  CSA_P1  : 9.93877e-03 ± 6.06675e-04
  CSA_P2  : -4.88847e-05 ± 9.23894e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [4, 5]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2751', '1.800', '0.1379', '1.799', '0.0912', '7.000', '0.7088', 1, 1, 1, 1, 1728322027.6180668]
VI_after__Init : ['1.202', '0.2751', '1.800', '0.1380', '1.801', '0.0842', '7.000', '0.7080', 1, 1, 1, 1, 1728322035.8114762]
VI_at__the_End : ['1.202', '0.4840', '1.800', '0.1359', '1.804', '0.1174', '7.000', '0.7087', 1, 1, 1, 1, 1728322098.036644]