TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_30_25
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-008-026-02 | FUSED_ID : 6359364768413811106
  IC_TEMP :  -65.13 | VDDM : 1124.56 | AUX_INT :   -9.79 | CsaBias :   76.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66481e-03 / 2
  ADC_P0  : -9.79059e-03 ± 2.76568e-02
  ADC_P1  : 8.69127e-03 ± 6.93270e-04
  ADC_P2  : -6.63007e-06 ± 3.45035e-06
  CSA_Chi2/NDF : 1.35467e-04 / 2
  CSA_P0  : 5.85609e-02 ± 7.76318e-03
  CSA_P1  : 9.45533e-03 ± 5.84899e-04
  CSA_P2  : -4.26986e-05 ± 8.90733e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [75, 83, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2548', '1.800', '0.1746', '1.799', '0.0889', '7.000', '0.7080', 1, 1, 1, 1, 1728322225.0719442]
VI_after__Init : ['1.202', '0.2554', '1.800', '0.1748', '1.800', '0.0838', '7.000', '0.7079', 1, 1, 1, 1, 1728322233.4003007]
VI_at__the_End : ['1.202', '0.4787', '1.800', '0.1377', '1.804', '0.1181', '7.000', '0.7086', 1, 1, 1, 1, 1728322297.368414]