TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_59_50
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-009-011-08 | FUSED_ID : 6359364768413814968
  IC_TEMP :  -64.95 | VDDM : 1126.08 | AUX_INT :   -9.20 | CsaBias :   76.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.59338e-03 / 2
  ADC_P0  : -9.20390e-03 ± 2.70778e-02
  ADC_P1  : 8.64166e-03 ± 6.82493e-04
  ADC_P2  : -6.24913e-06 ± 3.41302e-06
  CSA_Chi2/NDF : 1.41740e-04 / 2
  CSA_P0  : 5.99749e-02 ± 7.94088e-03
  CSA_P1  : 1.00522e-02 ± 5.98288e-04
  CSA_P2  : -5.13404e-05 ± 9.11122e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 84, 93, 94, 101, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1705', '1.800', '0.1332', '1.800', '0.0908', '7.000', '0.7073', 1, 1, 1, 1, 1728323990.055858]
VI_after__Init : ['1.202', '0.1705', '1.800', '0.1332', '1.800', '0.0854', '7.000', '0.7073', 1, 1, 1, 1, 1728323998.3190906]
VI_at__the_End : ['1.201', '0.4853', '1.800', '0.1402', '1.800', '0.1163', '7.000', '0.7079', 1, 1, 1, 1, 1728324066.8138134]