TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_54_54
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-009-014-08 | FUSED_ID : 6359364768413815016
  IC_TEMP :  -65.77 | VDDM : 1127.12 | AUX_INT :   -8.28 | CsaBias :   66.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23445e-03 / 2
  ADC_P0  : -8.28473e-03 ± 2.38067e-02
  ADC_P1  : 8.41331e-03 ± 5.85581e-04
  ADC_P2  : -5.92085e-06 ± 2.85558e-06
  CSA_Chi2/NDF : 1.79324e-04 / 2
  CSA_P0  : 5.91729e-02 ± 8.93186e-03
  CSA_P1  : 1.05145e-02 ± 6.72951e-04
  CSA_P2  : -5.94025e-05 ± 1.02482e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [31, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [66, 87, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2452', '1.800', '0.1436', '1.800', '0.0913', '7.000', '0.7069', 1, 1, 1, 1, 1728323694.1159308]
VI_after__Init : ['1.201', '0.2451', '1.800', '0.1436', '1.799', '0.0856', '7.000', '0.7070', 1, 1, 1, 1, 1728323703.05022]
VI_at__the_End : ['1.202', '0.4840', '1.800', '0.1400', '1.801', '0.1138', '7.000', '0.7077', 1, 1, 1, 1, 1728323762.3247168]