TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_46_42
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-009-019-15 | FUSED_ID : 6359364768413815103
  IC_TEMP :  -71.51 | VDDM : 1100.74 | AUX_INT :  -10.10 | CsaBias :   75.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68024e-03 / 2
  ADC_P0  : -1.00985e-02 ± 2.77450e-02
  ADC_P1  : 8.59829e-03 ± 6.75393e-04
  ADC_P2  : -7.08528e-06 ± 3.25981e-06
  CSA_Chi2/NDF : 1.48812e-04 / 2
  CSA_P0  : 5.98135e-02 ± 8.13657e-03
  CSA_P1  : 9.80797e-03 ± 6.13032e-04
  CSA_P2  : -5.10306e-05 ± 9.33575e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [74]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [33, 52]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3654', '1.800', '0.1283', '1.799', '0.0967', '7.000', '0.7069', 1, 1, 1, 1, 1728323202.0996432]
VI_after__Init : ['1.202', '0.3656', '1.800', '0.1286', '1.800', '0.0915', '7.000', '0.7072', 1, 1, 1, 1, 1728323210.9218962]
VI_at__the_End : ['1.202', '0.4710', '1.800', '0.1387', '1.804', '0.1202', '7.000', '0.7076', 1, 1, 1, 1, 1728323272.0909925]