TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_45_04
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-009-020-15 | FUSED_ID : 6359364768413815119
  IC_TEMP :  -73.95 | VDDM : 1117.78 | AUX_INT :   -8.60 | CsaBias :   52.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32806e-03 / 2
  ADC_P0  : -8.60459e-03 ± 2.46916e-02
  ADC_P1  : 8.77425e-03 ± 6.29963e-04
  ADC_P2  : -6.61180e-06 ± 3.18591e-06
  CSA_Chi2/NDF : 1.62740e-04 / 2
  CSA_P0  : 6.07427e-02 ± 8.50884e-03
  CSA_P1  : 1.04105e-02 ± 6.41079e-04
  CSA_P2  : -5.98418e-05 ± 9.76288e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [29]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [62, 72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1442', '1.800', '0.1400', '1.800', '0.0824', '6.999', '0.7072', 1, 1, 1, 1, 1728323104.2803476]
VI_after__Init : ['1.202', '0.1443', '1.800', '0.1400', '1.800', '0.0772', '7.000', '0.7072', 1, 1, 1, 1, 1728323112.3237226]
VI_at__the_End : ['1.202', '0.4739', '1.800', '0.1405', '1.801', '0.1200', '7.000', '0.7077', 1, 1, 1, 1, 1728323174.336726]