TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_40_07
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-009-023-15 | FUSED_ID : 6359364768413815167
  IC_TEMP :  -63.95 | VDDM : 1113.63 | AUX_INT :   -7.07 | CsaBias :   63.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18474e-03 / 2
  ADC_P0  : -7.06843e-03 ± 2.33091e-02
  ADC_P1  : 7.94213e-03 ± 5.41008e-04
  ADC_P2  : -5.37390e-06 ± 2.48523e-06
  CSA_Chi2/NDF : 1.41499e-04 / 2
  CSA_P0  : 5.56848e-02 ± 7.93413e-03
  CSA_P1  : 9.80237e-03 ± 5.97780e-04
  CSA_P2  : -4.94506e-05 ± 9.10348e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [74]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2185', '1.800', '0.1484', '1.799', '0.0880', '7.000', '0.7072', 1, 1, 1, 1, 1728322807.7341022]
VI_after__Init : ['1.202', '0.2186', '1.800', '0.1483', '1.800', '0.0830', '7.000', '0.7075', 1, 1, 1, 1, 1728322815.8225195]
VI_at__the_End : ['1.202', '0.4756', '1.800', '0.1347', '1.800', '0.1150', '7.000', '0.7079', 1, 1, 1, 1, 1728322883.8040352]