TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_38_29
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-009-024-15 | FUSED_ID : 6359364768413815183
  IC_TEMP :  -69.43 | VDDM : 1117.17 | AUX_INT :  -10.51 | CsaBias :   76.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63083e-03 / 2
  ADC_P0  : -1.05142e-02 ± 2.72797e-02
  ADC_P1  : 8.76292e-03 ± 6.68247e-04
  ADC_P2  : -7.72574e-06 ± 3.24494e-06
  CSA_Chi2/NDF : 1.72770e-04 / 2
  CSA_P0  : 6.00913e-02 ± 8.76710e-03
  CSA_P1  : 1.02114e-02 ± 6.60538e-04
  CSA_P2  : -5.40663e-05 ± 1.00592e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [14, 73]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3419', '1.800', '0.1715', '1.800', '0.0936', '7.000', '0.7083', 1, 1, 1, 1, 1728322708.7902641]
VI_after__Init : ['1.202', '0.3419', '1.800', '0.1717', '1.801', '0.0864', '7.000', '0.7074', 1, 1, 1, 1, 1728322716.9926586]
VI_at__the_End : ['1.198', '0.4836', '1.800', '0.1388', '1.807', '0.1188', '7.000', '0.7080', 1, 1, 1, 1, 1728322784.6131244]