TEST_NAME : Wafer
TEST_DATE : 24_10_07-19_35_12
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-009-026-15 | FUSED_ID : 6359364768413815215
  IC_TEMP :  -65.95 | VDDM : 1112.48 | AUX_INT :   -8.86 | CsaBias :   75.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30442e-03 / 2
  ADC_P0  : -8.85965e-03 ± 2.44536e-02
  ADC_P1  : 8.46071e-03 ± 5.98257e-04
  ADC_P2  : -6.27496e-06 ± 2.90379e-06
  CSA_Chi2/NDF : 1.70844e-04 / 2
  CSA_P0  : 6.02679e-02 ± 8.71810e-03
  CSA_P1  : 9.61658e-03 ± 6.56846e-04
  CSA_P2  : -4.64684e-05 ± 1.00030e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [16, 92, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2645', '1.800', '0.1385', '1.800', '0.0863', '7.000', '0.7078', 1, 1, 1, 1, 1728322512.0697]
VI_after__Init : ['1.202', '0.2649', '1.800', '0.1385', '1.801', '0.0807', '7.000', '0.7075', 1, 1, 1, 1, 1728322520.9200327]
VI_at__the_End : ['1.202', '0.4794', '1.800', '0.1392', '1.804', '0.1161', '7.000', '0.7085', 1, 1, 1, 1, 1728322581.5237553]