TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_16_17
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-002-06 | FUSED_ID : 6359364768413818918
  IC_TEMP :  -71.58 | VDDM : 1117.25 | AUX_INT :   -8.66 | CsaBias :   60.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09847e-03 / 2
  ADC_P0  : -8.65771e-03 ± 2.23602e-02
  ADC_P1  : 8.75831e-03 ± 5.55291e-04
  ADC_P2  : -7.47657e-06 ± 2.72636e-06
  CSA_Chi2/NDF : 1.70346e-04 / 2
  CSA_P0  : 5.67933e-02 ± 8.70538e-03
  CSA_P1  : 1.00774e-02 ± 6.55888e-04
  CSA_P2  : -5.30085e-05 ± 9.98840e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [11]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1337', '1.800', '0.1466', '1.800', '0.0840', '7.000', '0.7078', 1, 1, 1, 1, 1728324977.1610417]
VI_after__Init : ['1.202', '0.1337', '1.800', '0.1466', '1.800', '0.0787', '7.000', '0.7076', 1, 1, 1, 1, 1728324985.2725823]
VI_at__the_End : ['1.201', '0.4761', '1.800', '0.1380', '1.802', '0.1170', '7.000', '0.7085', 1, 1, 1, 1, 1728325053.5602086]