TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_17_56
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-003-06 | FUSED_ID : 6359364768413818934
  IC_TEMP :  -72.29 | VDDM : 1101.79 | AUX_INT :  -10.15 | CsaBias :   77.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51820e-03 / 2
  ADC_P0  : -1.01544e-02 ± 2.63757e-02
  ADC_P1  : 8.85195e-03 ± 6.69805e-04
  ADC_P2  : -6.84999e-06 ± 3.39348e-06
  CSA_Chi2/NDF : 2.04680e-04 / 2
  CSA_P0  : 6.06319e-02 ± 9.54245e-03
  CSA_P1  : 1.04219e-02 ± 7.18955e-04
  CSA_P2  : -5.67634e-05 ± 1.09488e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4366', '1.800', '0.1522', '1.799', '0.1001', '7.000', '0.7076', 1, 1, 1, 1, 1728325075.5884733]
VI_after__Init : ['1.201', '0.4379', '1.800', '0.1523', '1.800', '0.0940', '7.000', '0.7078', 1, 1, 1, 1, 1728325084.3058028]
VI_at__the_End : ['1.202', '0.4869', '1.800', '0.1432', '1.805', '0.1181', '7.000', '0.7084', 1, 1, 1, 1, 1728325153.1765711]