TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_26_09
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-008-06 | FUSED_ID : 6359364768413819014
  IC_TEMP :  -65.42 | VDDM : 1110.15 | AUX_INT :   -9.47 | CsaBias :   66.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54456e-03 / 2
  ADC_P0  : -9.46779e-03 ± 2.66580e-02
  ADC_P1  : 8.47245e-03 ± 6.60125e-04
  ADC_P2  : -5.82315e-06 ± 3.25245e-06
  CSA_Chi2/NDF : 1.86479e-04 / 2
  CSA_P0  : 5.85060e-02 ± 9.10831e-03
  CSA_P1  : 1.01448e-02 ± 6.86245e-04
  CSA_P2  : -5.38537e-05 ± 1.04507e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [54]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4265', '1.800', '0.1511', '1.800', '0.1045', '7.000', '0.7079', 1, 1, 1, 1, 1728325569.0592363]
VI_after__Init : ['1.202', '0.4271', '1.800', '0.1513', '1.800', '0.0987', '7.000', '0.7079', 1, 1, 1, 1, 1728325577.2485774]
VI_at__the_End : ['1.201', '0.4767', '1.800', '0.1395', '1.806', '0.1175', '7.000', '0.7086', 1, 1, 1, 1, 1728325645.379385]