TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_27_47
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-009-06 | FUSED_ID : 6359364768413819030
  IC_TEMP :  -64.92 | VDDM : 1121.26 | AUX_INT :   -7.84 | CsaBias :   72.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29075e-03 / 2
  ADC_P0  : -7.83671e-03 ± 2.43270e-02
  ADC_P1  : 8.10350e-03 ± 5.74643e-04
  ADC_P2  : -5.54916e-06 ± 2.69335e-06
  CSA_Chi2/NDF : 1.24217e-04 / 2
  CSA_P0  : 5.75249e-02 ± 7.43383e-03
  CSA_P1  : 9.70221e-03 ± 5.60086e-04
  CSA_P2  : -4.83883e-05 ± 8.52944e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [64, 104, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [35, 77, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2339', '1.800', '0.1322', '1.799', '0.0850', '7.000', '0.7076', 1, 1, 1, 1, 1728325667.565575]
VI_after__Init : ['1.202', '0.2340', '1.800', '0.1323', '1.800', '0.0798', '7.000', '0.7079', 1, 1, 1, 1, 1728325675.7579067]
VI_at__the_End : ['1.202', '0.4719', '1.800', '0.1347', '1.802', '0.1170', '7.000', '0.7086', 1, 1, 1, 1, 1728325735.4523194]