TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_29_25
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-010-06 | FUSED_ID : 6359364768413819046
  IC_TEMP :  -68.89 | VDDM : 1110.96 | AUX_INT :   -9.70 | CsaBias :   69.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33443e-03 / 2
  ADC_P0  : -9.70222e-03 ± 2.46810e-02
  ADC_P1  : 8.82907e-03 ± 6.19012e-04
  ADC_P2  : -7.26886e-06 ± 3.08812e-06
  CSA_Chi2/NDF : 1.85660e-04 / 2
  CSA_P0  : 6.00849e-02 ± 9.08829e-03
  CSA_P1  : 1.02107e-02 ± 6.84737e-04
  CSA_P2  : -5.60078e-05 ± 1.04277e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [58]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2233', '1.800', '0.1514', '1.800', '0.0846', '7.000', '0.7078', 1, 1, 1, 1, 1728325765.405999]
VI_after__Init : ['1.202', '0.2233', '1.800', '0.1512', '1.799', '0.0793', '7.000', '0.7078', 1, 1, 1, 1, 1728325773.573397]
VI_at__the_End : ['1.201', '0.4746', '1.800', '0.1381', '1.804', '0.1186', '7.000', '0.7086', 1, 1, 1, 1, 1728325834.5735846]