TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_34_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-013-06 | FUSED_ID : 6359364768413819094
  IC_TEMP :  -62.84 | VDDM : 1115.18 | AUX_INT :   -7.73 | CsaBias :   68.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08165e-03 / 2
  ADC_P0  : -7.72892e-03 ± 2.22512e-02
  ADC_P1  : 8.54629e-03 ± 5.52065e-04
  ADC_P2  : -6.48024e-06 ± 2.70649e-06
  CSA_Chi2/NDF : 1.23782e-04 / 2
  CSA_P0  : 5.90805e-02 ± 7.42080e-03
  CSA_P1  : 9.65357e-03 ± 5.59104e-04
  CSA_P2  : -4.65273e-05 ± 8.51449e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [49]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2484', '1.800', '0.1356', '1.799', '0.0866', '7.000', '0.7077', 1, 1, 1, 1, 1728326061.6490111]
VI_after__Init : ['1.202', '0.2483', '1.800', '0.1356', '1.801', '0.0815', '7.000', '0.7077', 1, 1, 1, 1, 1728326070.4493256]
VI_at__the_End : ['1.202', '0.4789', '1.800', '0.1398', '1.801', '0.1146', '7.000', '0.7086', 1, 1, 1, 1, 1728326139.1070013]