TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_39_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-016-01 | FUSED_ID : 6359364768413819137
  IC_TEMP :  -69.52 | VDDM : 1119.70 | AUX_INT :   -8.36 | CsaBias :   76.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30365e-03 / 2
  ADC_P0  : -8.36056e-03 ± 2.44737e-02
  ADC_P1  : 8.55939e-03 ± 6.14675e-04
  ADC_P2  : -6.02392e-06 ± 3.05928e-06
  CSA_Chi2/NDF : 1.47045e-04 / 2
  CSA_P0  : 5.98598e-02 ± 8.08810e-03
  CSA_P1  : 1.01871e-02 ± 6.09380e-04
  CSA_P2  : -5.55473e-05 ± 9.28014e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [39, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [15, 20, 80, 106, 108, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2086', '1.800', '0.1338', '1.799', '0.0859', '7.000', '0.7077', 1, 1, 1, 1, 1728326358.7789295]
VI_after__Init : ['1.202', '0.2087', '1.800', '0.1338', '1.800', '0.0804', '7.000', '0.7079', 1, 1, 1, 1, 1728326366.7913265]
VI_at__the_End : ['1.202', '0.4782', '1.800', '0.1401', '1.803', '0.1179', '7.000', '0.7085', 1, 1, 1, 1, 1728326427.2396448]