TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_40_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-017-01 | FUSED_ID : 6359364768413819153
  IC_TEMP :  -68.34 | VDDM : 1126.34 | AUX_INT :   -9.22 | CsaBias :   67.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23502e-03 / 2
  ADC_P0  : -9.21707e-03 ± 2.37549e-02
  ADC_P1  : 8.61857e-03 ± 5.86701e-04
  ADC_P2  : -6.69403e-06 ± 2.88132e-06
  CSA_Chi2/NDF : 1.78572e-04 / 2
  CSA_P0  : 6.09092e-02 ± 8.91312e-03
  CSA_P1  : 1.05791e-02 ± 6.71539e-04
  CSA_P2  : -5.97532e-05 ± 1.02267e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [2, 33]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3940', '1.800', '0.1653', '1.800', '0.0943', '7.000', '0.7079', 1, 1, 1, 1, 1728326457.0982637]
VI_after__Init : ['1.202', '0.3948', '1.800', '0.1658', '1.800', '0.0884', '7.000', '0.7078', 1, 1, 1, 1, 1728326465.2766273]
VI_at__the_End : ['1.202', '0.4888', '1.800', '0.1404', '1.802', '0.1181', '7.000', '0.7087', 1, 1, 1, 1, 1728326524.91304]