TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_44_14
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-019-01 | FUSED_ID : 6359364768413819185
  IC_TEMP :  -62.90 | VDDM : 1115.12 | AUX_INT :  -10.66 | CsaBias :   73.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.95893e-03 / 2
  ADC_P0  : -1.06575e-02 ± 2.99925e-02
  ADC_P1  : 8.47198e-03 ± 7.21718e-04
  ADC_P2  : -6.73167e-06 ± 3.44633e-06
  CSA_Chi2/NDF : 1.33846e-04 / 2
  CSA_P0  : 6.00198e-02 ± 7.71658e-03
  CSA_P1  : 9.87477e-03 ± 5.81389e-04
  CSA_P2  : -4.79131e-05 ± 8.85386e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [8]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [13, 32, 68, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1866', '1.800', '0.1379', '1.799', '0.0915', '7.000', '0.7079', 1, 1, 1, 1, 1728326654.5430136]
VI_after__Init : ['1.202', '0.1866', '1.800', '0.1379', '1.801', '0.0859', '7.000', '0.7083', 1, 1, 1, 1, 1728326662.7284565]
VI_at__the_End : ['1.201', '0.4880', '1.800', '0.1380', '1.803', '0.1160', '7.000', '0.7087', 1, 1, 1, 1, 1728326730.7898164]