TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_47_31
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-021-01 | FUSED_ID : 6359364768413819217
  IC_TEMP :  -72.17 | VDDM : 1117.55 | AUX_INT :   -9.59 | CsaBias :   73.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53383e-03 / 2
  ADC_P0  : -9.58931e-03 ± 2.65556e-02
  ADC_P1  : 8.32408e-03 ± 6.44193e-04
  ADC_P2  : -5.69245e-06 ± 3.11040e-06
  CSA_Chi2/NDF : 1.47848e-04 / 2
  CSA_P0  : 5.93786e-02 ± 8.11018e-03
  CSA_P1  : 1.01896e-02 ± 6.11043e-04
  CSA_P2  : -5.74402e-05 ± 9.30547e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1339', '1.800', '0.1352', '1.799', '0.0887', '7.000', '0.7088', 1, 1, 1, 1, 1728326851.6665547]
VI_after__Init : ['1.202', '0.1339', '1.800', '0.1352', '1.799', '0.0808', '7.000', '0.7079', 1, 1, 1, 1, 1728326859.7869895]
VI_at__the_End : ['1.202', '0.4673', '1.800', '0.1380', '1.800', '0.1223', '7.000', '0.7085', 1, 1, 1, 1, 1728326919.3158898]