TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_49_10
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-022-01 | FUSED_ID : 6359364768413819233
  IC_TEMP :  -64.01 | VDDM : 1121.08 | AUX_INT :   -9.85 | CsaBias :   76.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37086e-03 / 2
  ADC_P0  : -9.84846e-03 ± 2.49998e-02
  ADC_P1  : 8.67161e-03 ± 6.12135e-04
  ADC_P2  : -7.25814e-06 ± 2.97524e-06
  CSA_Chi2/NDF : 1.16020e-04 / 2
  CSA_P0  : 5.93136e-02 ± 7.18439e-03
  CSA_P1  : 9.69186e-03 ± 5.41292e-04
  CSA_P2  : -4.59120e-05 ± 8.24323e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [97, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [30, 45]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2440', '1.800', '0.1330', '1.800', '0.0884', '7.000', '0.7087', 1, 1, 1, 1, 1728326949.7658029]
VI_after__Init : ['1.202', '0.2440', '1.800', '0.1330', '1.799', '0.0814', '7.000', '0.7079', 1, 1, 1, 1, 1728326958.5202107]
VI_at__the_End : ['1.202', '0.4840', '1.800', '0.1363', '1.804', '0.1160', '7.000', '0.7089', 1, 1, 1, 1, 1728327019.1547866]