TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_50_49
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-023-01 | FUSED_ID : 6359364768413819249
  IC_TEMP :  -62.96 | VDDM : 1116.42 | AUX_INT :   -9.70 | CsaBias :   78.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66903e-03 / 2
  ADC_P0  : -9.69738e-03 ± 2.77136e-02
  ADC_P1  : 8.08793e-03 ± 6.49457e-04
  ADC_P2  : -5.57196e-06 ± 3.02587e-06
  CSA_Chi2/NDF : 9.47837e-05 / 2
  CSA_P0  : 5.98291e-02 ± 6.49365e-03
  CSA_P1  : 9.12274e-03 ± 4.89250e-04
  CSA_P2  : -3.97936e-05 ± 7.45070e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [39]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [37, 88, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3253', '1.800', '0.1635', '1.800', '0.0915', '7.000', '0.7079', 1, 1, 1, 1, 1728327048.9097369]
VI_after__Init : ['1.202', '0.3251', '1.800', '0.1651', '1.800', '0.0881', '7.000', '0.7081', 1, 1, 1, 1, 1728327057.1001277]
VI_at__the_End : ['1.202', '0.4733', '1.800', '0.1370', '1.800', '0.1172', '7.000', '0.7086', 1, 1, 1, 1, 1728327119.227672]