TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_55_43
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-026-01 | FUSED_ID : 6359364768413819297
  IC_TEMP :  -60.79 | VDDM : 1113.78 | AUX_INT :   -8.53 | CsaBias :   74.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57227e-03 / 2
  ADC_P0  : -8.52654e-03 ± 2.68781e-02
  ADC_P1  : 8.32107e-03 ± 6.49958e-04
  ADC_P2  : -5.88468e-06 ± 3.12093e-06
  CSA_Chi2/NDF : 1.20501e-04 / 2
  CSA_P0  : 5.90583e-02 ± 7.32180e-03
  CSA_P1  : 9.59283e-03 ± 5.51645e-04
  CSA_P2  : -4.38040e-05 ± 8.40089e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [28, 37]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3999', '1.800', '0.1262', '1.800', '0.0947', '7.000', '0.7079', 1, 1, 1, 1, 1728327343.3443062]
VI_after__Init : ['1.202', '0.4001', '1.800', '0.1262', '1.800', '0.0892', '7.000', '0.7079', 1, 1, 1, 1, 1728327351.4337213]
VI_at__the_End : ['1.202', '0.4864', '1.800', '0.1355', '1.800', '0.1156', '7.000', '0.7086', 1, 1, 1, 1, 1728327420.1876254]