TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_57_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-010-027-01 | FUSED_ID : 6359364768413819313
  IC_TEMP :  -70.46 | VDDM : 1114.63 | AUX_INT :  -10.35 | CsaBias :   66.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.92263e-03 / 2
  ADC_P0  : -1.03499e-02 ± 2.97239e-02
  ADC_P1  : 8.63261e-03 ± 7.30012e-04
  ADC_P2  : -6.96879e-06 ± 3.55639e-06
  CSA_Chi2/NDF : 1.55300e-04 / 2
  CSA_P0  : 5.66943e-02 ± 8.31205e-03
  CSA_P1  : 1.00880e-02 ± 6.26253e-04
  CSA_P2  : -5.25963e-05 ± 9.53709e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [20, 22, 63]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1953', '1.800', '0.1597', '1.800', '0.0855', '7.000', '0.7080', 1, 1, 1, 1, 1728327441.5671008]
VI_after__Init : ['1.202', '0.1953', '1.800', '0.1598', '1.800', '0.0802', '7.000', '0.7078', 1, 1, 1, 1, 1728327450.4335063]
VI_at__the_End : ['1.202', '0.4778', '1.800', '0.1355', '1.801', '0.1166', '7.000', '0.7085', 1, 1, 1, 1, 1728327509.8350484]