TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_38_24
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-003-11 | FUSED_ID : 6359364768413823035
  IC_TEMP :  -66.43 | VDDM : 1110.38 | AUX_INT :   -8.58 | CsaBias :   72.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53158e-03 / 2
  ADC_P0  : -8.58236e-03 ± 2.64747e-02
  ADC_P1  : 9.03951e-03 ± 6.80209e-04
  ADC_P2  : -7.82705e-06 ± 3.45883e-06
  CSA_Chi2/NDF : 1.71251e-04 / 2
  CSA_P0  : 5.98440e-02 ± 8.72848e-03
  CSA_P1  : 1.01371e-02 ± 6.57628e-04
  CSA_P2  : -5.17694e-05 ± 1.00149e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [44, 73]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [40, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2166', '1.800', '0.1322', '1.800', '0.0874', '7.000', '0.7073', 1, 1, 1, 1, 1728329903.9728765]
VI_after__Init : ['1.202', '0.2166', '1.800', '0.1323', '1.799', '0.0818', '7.000', '0.7072', 1, 1, 1, 1, 1728329912.0582924]
VI_at__the_End : ['1.202', '0.4863', '1.800', '0.1407', '1.804', '0.1157', '7.000', '0.7076', 1, 1, 1, 1, 1728329976.352678]