TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_31_51
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-007-11 | FUSED_ID : 6359364768413823099
  IC_TEMP :  -67.17 | VDDM : 1123.86 | AUX_INT :   -8.67 | CsaBias :   67.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18354e-03 / 2
  ADC_P0  : -8.67241e-03 ± 2.32651e-02
  ADC_P1  : 8.57548e-03 ± 5.75925e-04
  ADC_P2  : -6.54098e-06 ± 2.82601e-06
  CSA_Chi2/NDF : 1.63759e-04 / 2
  CSA_P0  : 5.95319e-02 ± 8.53543e-03
  CSA_P1  : 1.03192e-02 ± 6.43083e-04
  CSA_P2  : -5.43120e-05 ± 9.79339e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [37]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [17]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1932', '1.800', '0.1512', '1.800', '0.0872', '7.000', '0.7076', 1, 1, 1, 1, 1728329510.995552]
VI_after__Init : ['1.202', '0.1932', '1.800', '0.1512', '1.800', '0.0819', '7.000', '0.7077', 1, 1, 1, 1, 1728329519.0999634]
VI_at__the_End : ['1.202', '0.4897', '1.800', '0.1400', '1.804', '0.1173', '7.000', '0.7083', 1, 1, 1, 1, 1728329579.3903341]