TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_28_34
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-009-11 | FUSED_ID : 6359364768413823131
  IC_TEMP :  -67.04 | VDDM : 1118.26 | AUX_INT :   -7.83 | CsaBias :   70.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23681e-03 / 2
  ADC_P0  : -7.82852e-03 ± 2.37642e-02
  ADC_P1  : 8.78402e-03 ± 5.95522e-04
  ADC_P2  : -7.33605e-06 ± 2.95168e-06
  CSA_Chi2/NDF : 1.51942e-04 / 2
  CSA_P0  : 5.93859e-02 ± 8.22169e-03
  CSA_P1  : 9.85783e-03 ± 6.19445e-04
  CSA_P2  : -4.88050e-05 ± 9.43341e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [61, 91, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2806', '1.800', '0.1514', '1.799', '0.1007', '7.000', '0.7083', 1, 1, 1, 1, 1728329313.7734692]
VI_after__Init : ['1.202', '0.2809', '1.800', '0.1514', '1.799', '0.0935', '7.000', '0.7080', 1, 1, 1, 1, 1728329322.476786]
VI_at__the_End : ['1.202', '0.4824', '1.800', '0.1403', '1.800', '0.1169', '7.000', '0.7082', 1, 1, 1, 1, 1728329386.1759396]