TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_26_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-010-11 | FUSED_ID : 6359364768413823147
  IC_TEMP :  -65.03 | VDDM : 1118.65 | AUX_INT :   -9.69 | CsaBias :   66.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58480e-03 / 2
  ADC_P0  : -9.69496e-03 ± 2.69742e-02
  ADC_P1  : 8.54038e-03 ± 6.62218e-04
  ADC_P2  : -6.49369e-06 ± 3.22915e-06
  CSA_Chi2/NDF : 1.32156e-04 / 2
  CSA_P0  : 5.96254e-02 ± 7.66772e-03
  CSA_P1  : 9.74319e-03 ± 5.77707e-04
  CSA_P2  : -4.78742e-05 ± 8.79779e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [68]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [75, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1507', '1.800', '0.1373', '1.800', '0.0885', '7.000', '0.7078', 1, 1, 1, 1, 1728329214.788905]
VI_after__Init : ['1.202', '0.1508', '1.800', '0.1373', '1.800', '0.0829', '7.000', '0.7078', 1, 1, 1, 1, 1728329223.012248]
VI_at__the_End : ['1.202', '0.4780', '1.800', '0.1391', '1.800', '0.1167', '7.000', '0.7084', 1, 1, 1, 1, 1728329284.5136333]