TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_25_17
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-011-11 | FUSED_ID : 6359364768413823163
  IC_TEMP :  -64.68 | VDDM : 1117.63 | AUX_INT :   -7.51 | CsaBias :   61.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39942e-03 / 2
  ADC_P0  : -7.51325e-03 ± 2.53214e-02
  ADC_P1  : 8.62416e-03 ± 6.28442e-04
  ADC_P2  : -6.90435e-06 ± 3.07800e-06
  CSA_Chi2/NDF : 1.21706e-04 / 2
  CSA_P0  : 5.90186e-02 ± 7.35832e-03
  CSA_P1  : 9.82413e-03 ± 5.54397e-04
  CSA_P2  : -4.96663e-05 ± 8.44280e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1730', '1.800', '0.1300', '1.799', '0.0815', '7.000', '0.7086', 1, 1, 1, 1, 1728329116.6421673]
VI_after__Init : ['1.202', '0.1731', '1.800', '0.1300', '1.800', '0.0744', '7.000', '0.7077', 1, 1, 1, 1, 1728329125.4006166]
VI_at__the_End : ['1.202', '0.4776', '1.800', '0.1382', '1.799', '0.1170', '7.000', '0.7086', 1, 1, 1, 1, 1728329188.3508573]