TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_23_39
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-012-11 | FUSED_ID : 6359364768413823179
  IC_TEMP :  -60.44 | VDDM : 1119.20 | AUX_INT :   -8.22 | CsaBias :   68.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02413e-03 / 2
  ADC_P0  : -8.21700e-03 ± 2.16011e-02
  ADC_P1  : 8.55277e-03 ± 5.28316e-04
  ADC_P2  : -6.91092e-06 ± 2.55406e-06
  CSA_Chi2/NDF : 1.17818e-04 / 2
  CSA_P0  : 6.16307e-02 ± 7.23982e-03
  CSA_P1  : 9.54294e-03 ± 5.45469e-04
  CSA_P2  : -4.48273e-05 ± 8.30684e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [57]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2472', '1.800', '0.1210', '1.799', '0.0896', '7.000', '0.7079', 1, 1, 1, 1, 1728329018.6306548]
VI_after__Init : ['1.202', '0.2472', '1.800', '0.1210', '1.800', '0.0839', '7.000', '0.7079', 1, 1, 1, 1, 1728329027.4708962]
VI_at__the_End : ['1.202', '0.4822', '1.800', '0.1382', '1.799', '0.1170', '7.000', '0.7083', 1, 1, 1, 1, 1728329089.7972116]