TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_22_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-013-11 | FUSED_ID : 6359364768413823195
  IC_TEMP :  -66.96 | VDDM : 1114.96 | AUX_INT :   -9.79 | CsaBias :   78.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48823e-03 / 2
  ADC_P0  : -9.79472e-03 ± 2.60969e-02
  ADC_P1  : 8.87519e-03 ± 6.58427e-04
  ADC_P2  : -7.39151e-06 ± 3.29764e-06
  CSA_Chi2/NDF : 1.41350e-04 / 2
  CSA_P0  : 6.13153e-02 ± 7.92994e-03
  CSA_P1  : 9.96205e-03 ± 5.97464e-04
  CSA_P2  : -5.13362e-05 ± 9.09867e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [39, 53, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4563', '1.800', '0.1500', '1.799', '0.0993', '7.000', '0.7079', 1, 1, 1, 1, 1728328920.7879546]
VI_after__Init : ['1.201', '0.4569', '1.800', '0.1497', '1.801', '0.0937', '7.000', '0.7079', 1, 1, 1, 1, 1728328928.9773502]
VI_at__the_End : ['1.202', '0.4818', '1.800', '0.1412', '1.799', '0.1153', '7.000', '0.7087', 1, 1, 1, 1, 1728328991.6896114]