TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_18_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-015-11 | FUSED_ID : 6359364768413823227
  IC_TEMP :  -61.08 | VDDM : 1128.29 | AUX_INT :   -8.54 | CsaBias :   75.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44948e-03 / 2
  ADC_P0  : -8.54477e-03 ± 2.58360e-02
  ADC_P1  : 8.44468e-03 ± 6.41157e-04
  ADC_P2  : -5.77209e-06 ± 3.15598e-06
  CSA_Chi2/NDF : 1.48006e-04 / 2
  CSA_P0  : 6.05589e-02 ± 8.11451e-03
  CSA_P1  : 1.03407e-02 ± 6.11370e-04
  CSA_P2  : -5.50334e-05 ± 9.31044e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [104, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1862', '1.800', '0.1367', '1.800', '0.0815', '7.000', '0.7081', 1, 1, 1, 1, 1728328723.7776244]
VI_after__Init : ['1.202', '0.1862', '1.800', '0.1367', '1.800', '0.0763', '7.000', '0.7079', 1, 1, 1, 1, 1728328732.4529738]
VI_at__the_End : ['1.202', '0.4904', '1.800', '0.1378', '1.800', '0.1156', '7.000', '0.7088', 1, 1, 1, 1, 1728328800.4058588]