TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_15_26
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-017-12 | FUSED_ID : 6359364768413823260
  IC_TEMP :  -70.61 | VDDM : 1121.70 | AUX_INT :   -9.79 | CsaBias :   60.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48823e-03 / 2
  ADC_P0  : -9.79472e-03 ± 2.60969e-02
  ADC_P1  : 8.87519e-03 ± 6.58427e-04
  ADC_P2  : -7.39151e-06 ± 3.29764e-06
  CSA_Chi2/NDF : 1.44702e-04 / 2
  CSA_P0  : 6.07486e-02 ± 8.02343e-03
  CSA_P1  : 1.01361e-02 ± 6.04508e-04
  CSA_P2  : -5.47702e-05 ± 9.20594e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [22, 64, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3603', '1.800', '0.1301', '1.799', '0.0953', '7.000', '0.7081', 1, 1, 1, 1, 1728328526.294447]
VI_after__Init : ['1.202', '0.3604', '1.800', '0.1302', '1.800', '0.0902', '7.000', '0.7083', 1, 1, 1, 1, 1728328534.2817636]
VI_at__the_End : ['1.202', '0.4777', '1.800', '0.1408', '1.801', '0.1181', '7.000', '0.7088', 1, 1, 1, 1, 1728328601.493682]