TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_13_48
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-018-12 | FUSED_ID : 6359364768413823276
  IC_TEMP :  -69.94 | VDDM : 1113.56 | AUX_INT :  -10.34 | CsaBias :   67.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68319e-03 / 2
  ADC_P0  : -1.03418e-02 ± 2.77963e-02
  ADC_P1  : 8.73451e-03 ± 6.95174e-04
  ADC_P2  : -6.78259e-06 ± 3.46288e-06
  CSA_Chi2/NDF : 1.83874e-04 / 2
  CSA_P0  : 5.93772e-02 ± 9.04445e-03
  CSA_P1  : 1.02840e-02 ± 6.81434e-04
  CSA_P2  : -5.72275e-05 ± 1.03774e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2100', '1.800', '0.1503', '1.800', '0.0962', '7.000', '0.7080', 1, 1, 1, 1, 1728328428.3658273]
VI_after__Init : ['1.202', '0.2100', '1.800', '0.1505', '1.801', '0.0906', '7.000', '0.7079', 1, 1, 1, 1, 1728328436.4581535]
VI_at__the_End : ['1.202', '0.4753', '1.800', '0.1397', '1.800', '0.1198', '7.000', '0.7086', 1, 1, 1, 1, 1728328497.1116645]