TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_10_31
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-020-12 | FUSED_ID : 6359364768413823308
  IC_TEMP :  -71.67 | VDDM : 1121.57 | AUX_INT :  -10.44 | CsaBias :   74.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.00820e-03 / 2
  ADC_P0  : -1.04441e-02 ± 3.04746e-02
  ADC_P1  : 8.57344e-03 ± 7.66662e-04
  ADC_P2  : -5.61604e-06 ± 3.85375e-06
  CSA_Chi2/NDF : 1.46153e-04 / 2
  CSA_P0  : 6.08227e-02 ± 8.06356e-03
  CSA_P1  : 1.02932e-02 ± 6.07531e-04
  CSA_P2  : -5.76761e-05 ± 9.25198e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [13, 112, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2034', '1.800', '0.1775', '1.800', '0.0898', '7.000', '0.7088', 1, 1, 1, 1, 1728328230.6609552]
VI_after__Init : ['1.202', '0.2036', '1.800', '0.1776', '1.800', '0.0828', '7.000', '0.7080', 1, 1, 1, 1, 1728328239.3162055]
VI_at__the_End : ['1.202', '0.4737', '1.800', '0.1408', '1.804', '0.1203', '7.000', '0.7087', 1, 1, 1, 1, 1728328299.9825113]